Serial Number:
78804764
Mark:
SURFACEWAVE
Status:
Abandoned-Failure to Respond
Status Date:
10-30-2007
Filing Date:
Registration Number:
N/A
Registration Date:
N/A
Thin film measurement devices in the nature of factory metrology tools or analytical instrumentation for measuring film thicknesses or film layer properties of integrated circuits
Mark Description:
N/A
Class:
Scientific
Type of Mark:
Trademark
Published for Opposition Date:
07-18-2006
Mark Drawing Status:
Standart Character Mark
Abandon Date:
10-03-2007
Business Name:
PHILIPS ELECTRONICS NORTH AMERICA CORPOR
Correspondent Name: