SURFACEWAVE
associated with 487 other trademarks
Thin film measurement devices in the nature of factory metrology tools or analytical instrumentation for measuring film thicknesses or film layer prop...

Words that describe this trademark:

thin film measurement  analytical instrumentation  nature factory  measurement devices  metrology tools  devices  instrumentation  tools  factory  film 

Serial Number:

78804764

Mark:

SURFACEWAVE

Status:

Abandoned-Failure to Respond

Status Date:

10-30-2007

Filing Date:

Registration Number:

N/A

Registration Date:

N/A

Goods and Services:

Thin film measurement devices in the nature of factory metrology tools or analytical instrumentation for measuring film thicknesses or film layer properties of integrated circuits

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

07-18-2006

Mark Drawing Status:

Standart Character Mark

Abandon Date:

10-03-2007

Business Name:

PHILIPS ELECTRONICS NORTH AMERICA CORPOR

Correspondent Name:

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