MULTISCAN
associated with 54 other trademarks
Technology supervision and inspection in the field of quality control of semiconductor wafers and reticles

Words that describe this trademark:

quality control  technology supervision  field quality  semiconductor wafers  supervision  control  inspection  wafers  reticles 

Serial Number:

86535227

Mark:

MULTISCAN

Status:

Cancelled-Section 8

Status Date:

09-23-2022

Filing Date:

Registration Number:

4912322

Registration Date:

03-08-2016

Goods and Services:

Technology supervision and inspection in the field of quality control of semiconductor wafers and reticles

Mark Description:

N/A

Class:

Scientific and technological services

Type of Mark:

Servicemark

Published for Opposition Date:

12-22-2015

Mark Drawing Status:

Standart Character Mark

Abandon Date:

N/A

Business Name:

MCDERMOTT WILL & EMERY LLP

Correspondent Name:

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