MAXTEK
associated with 10 other trademarks
Scientific and measuring apparatus and instruments, particularly for measuring thin layers during the application of thin-layer coatings and quartz cr...

Words that describe this trademark:

scientific measuring  thin layers  measuring apparatus  instruments  particularly  during  measuring  application  layers  apparatus 

Serial Number:

79139120

Mark:

MAXTEK

Status:

Status Date:

02-03-2021

Filing Date:

Registration Number:

4650896

Registration Date:

12-09-2014

Goods and Services:

Scientific and measuring apparatus and instruments, particularly for measuring thin layers during the application of thin-layer coatings and quartz crystal microbalances

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

09-23-2014

Mark Drawing Status:

4

Abandon Date:

N/A

Business Name:

1270 AVENUE OF THE AMERICAS, STE 501

Correspondent Name:

Recent Trademark filings by this company