INNOVATING TEST TECHNOLOGIES
associated with 15 other trademarks
PROBES, PROBE STATIONS, AND THEIR COMPONENTS AND ACCESSORIES, FOR ON-WAFER TESTING OF INTEGRATED CIRCUITS

Words that describe this trademark:

integrated circuits  components accessories  probe stations  circuits  onwafer  accessories  probes  testing  stations 

Serial Number:

76113829

Mark:

INNOVATING TEST TECHNOLOGIES

Status:

Cancelled-Section 8

Status Date:

04-04-2009

Filing Date:

Registration Number:

2589631

Registration Date:

07-02-2002

Goods and Services:

PROBES, PROBE STATIONS, AND THEIR COMPONENTS AND ACCESSORIES, FOR ON-WAFER TESTING OF INTEGRATED CIRCUITS

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

08-14-2001

Mark Drawing Status:

Typed Drawing

Abandon Date:

N/A

Business Name:

CHERNOFF VILHAUER MCCLUNG & STENZEL, LLP

Correspondent Name:

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