Serial Number:
98740012
Mark:
COMPLUS
Status:
New Application-Record initialized not assigned to examiner
Status Date:
09-09-2024
Filing Date:
Registration Number:
N/A
Registration Date:
N/A
Semiconductor wafer inspection system used to inspect wafers for darkfield defects, including particles, scratches, and humps, namely, inspection machines for the inspection of semiconductor wafers
Mark Description:
N/A
Class:
Scientific
Type of Mark:
Trademark
Published for Opposition Date:
N/A
Owner:
Mark Drawing Status:
4
Abandon Date:
N/A
Business Name:
TWO EMBARCADERO CENTER, SUITE 1900
Correspondent Name:
