ATTOFEMTO
associated with 0 other trademarks
Semiconductor wafer test and measurement device as employing optical interference patterns to measure voltages and currents

Words that describe this trademark:

semiconductor wafer  measurement device  optical interference  interference patterns  test measurement  wafer test  measure voltages  patterns  employing  device 

Serial Number:

76174425

Mark:

ATTOFEMTO

Status:

Cancelled-Section 8

Status Date:

09-23-2016

Filing Date:

Registration Number:

3021280

Registration Date:

11-29-2005

Goods and Services:

Semiconductor wafer test and measurement device as employing optical interference patterns to measure voltages and currents

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

05-07-2002

Mark Drawing Status:

Typed Drawing

Abandon Date:

N/A

Business Name:

DAVIS WRIGHT TREMAINE LLP

Correspondent Name:

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