ASE
associated with 54 other trademarks
Software for image analysis for identification of defects in semiconductor wafers and reticles

Words that describe this trademark:

software image analysis  image analysis  wafers  defects  analysis  reticles  identification 

Serial Number:

86887647

Mark:

ASE

Status:

Cancelled-Section 8

Status Date:

07-28-2023

Filing Date:

Registration Number:

5122030

Registration Date:

01-17-2017

Goods and Services:

Software for image analysis for identification of defects in semiconductor wafers and reticles

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

11-01-2016

Mark Drawing Status:

Standart Character Mark

Abandon Date:

N/A

Business Name:

MCDERMOTT WILL & EMERY LLP

Correspondent Name:

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